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Home >> Posts tagged "MRAM"

Tag: MRAM

Hprobe announces breakthroughs in MRAM wafer testing to support production ramp-up

  • English News
by Hordon Kim - 2022-12-09

Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, announced a new addition to its product line—the RF Pulse Module. This is the first commercially available testing system to both collect statistics of error rate of the memory unit

Hprobe receives order from tier-1 semiconductor manufacturer for wafer-level magnetic tester

  • English News
by Hordon Kim - 2021-04-28

Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, announced a significant order from a tier-1 semiconductor manufacturer for a wafer-level magnetic tester. The equipment will be used for research and development of magnetic materials and devices, which

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