pSemi® released two additions to its UltraCMOS+™ RF switch portfolio: the PE42544 SP4T RF switch and the PE42429 SPDT RF switch. Both devices deliver high isolation, low insertion loss, and industry-leading linearity for next-generation wireless infrastructure, test and measurement, and automated test equipment applications.
PE42544 UltraCMOS+™ SP4T RF Switch
The PE42544 is a high-isolation UltraCMOS+ SP4T RF switch operating from 9 kHz to 8.5 GHz. It delivers up to 40 dB isolation, a low insertion loss of 1.4 dB at 8.5 GHz, and a fast switching time of 300 ns.
Manufactured using pSemi’s patented UltraCMOS+ RF-SOI technology with HaRP™ enhancements, the device provides excellent linearity (61 dBm IIP3) and reliable operation from -40 °C to +105 °C. It is housed in a compact 20-lead, 3 × 3 mm QFN package with an MSL 1 rating.
“The PE42544 expands our high-performance RF switch portfolio, providing customers with a versatile SP4T solution engineered for demanding test environments and next‑generation RF systems,” said Rodd Novak, vice president of sales and marketing, pSemi.

PE42429 UltraCMOS+ SPDT RF Switch
The PE42429 is a high-isolation UltraCMOS+ SPDT RF switch designed for wireless infrastructure, test and measurement equipment, and ATE systems. Operating from 9 kHz to 8.5 GHz, it delivers 46 dB isolation at 6 GHz, a low insertion loss of 1.1 dB at 8.5 GHz, and a fast 490 ns switching time.
With HaRP™ technology and the UltraCMOS+ RF-SOI process, it achieves 65 dBm IIP3 linearity and reliable performance across -40 °C to +105 °C. The device is offered in a compact 12-lead, 2.0 × 2.0 mm QFN package with an MSL 1 rating.
“The PE42429 strengthens our RF switch portfolio with industry-leading isolation and linearity, enabling OEMs and test engineers to build next-generation RF systems with greater efficiency and signal integrity,” said Novak.




